Journal Article

·2010

Practical development of an Eclipse-based software fault prediction tool using Naive Bayes algorithm

Cagatay Catal , Ugur Sevim , Banu Di̇ri̇ YTU

Expert Systems with Applications

No open-access abstract is available for this article. Use the DOI link on the right to read the full text.

Keywords

Computer science Machine learning Software Naive Bayes classifier Eclipse Software quality Software development Fault (geology) Data mining Software metric Artificial intelligence Verification and validation Software fault tolerance Algorithm Operating system Support vector machine Engineering

Subject Areas

Software Engineering Research ·Information Systems ·Physical Sciences
Software Reliability and Analysis Research ·Software ·Physical Sciences
Software Testing and Debugging Techniques ·Software ·Physical Sciences

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